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Excimer laser recrystallization of amorphous Si films characterized by grazing X-ray diffraction and optical reflectivity

✍ Scribed by E.L. Mathé; J.G. Maillou; A. Naudon; E. Fogarassy; M. Elliq; S. De unamuno

Book ID: 107925740
Publisher: Elsevier Science
Year: 1989
Tongue: English
Weight: 380 KB
Volume: 43
Category: Article
ISSN: 0169-4332
DOI: 10.1016/0169-4332(89)90203-1

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## Abstract Nanocomposite thin films composed by (BaTiO~3~)~1–__x__~ –(CoFe~2~O~4~)__~x~__ with different cobalt ferrite concentrations (__x__) have been deposited by pulsed laser ablation on platinum covered Si(001) substrates. The films structure was studied by X‐ray diffraction and Raman spectro