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Characterization of erbium oxide sol–gel films and devices by grazing incidence X-ray reflectivity

✍ Scribed by S.L. Morelhão; G.E.S. Brito; E. Abramof


Book ID
117621028
Publisher
Elsevier Science
Year
2002
Tongue
English
Weight
376 KB
Volume
344
Category
Article
ISSN
0925-8388

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## Abstract The in‐plane structures of vapor deposited ultrathin films of distyryl‐oligothiophenes (DS‐2T) on SiO~2~ substrate were characterized by grazing incidence x‐ray diffractometry (GIXD). Two polymorphs, low‐temperature and high‐temperature phases, were identified, and the two dimensional u