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Characterization of nanometer-scale epitaxial structures by grazing-incidence x-ray diffraction and specular reflectivity

✍ Scribed by Lucas, C. A.; Hatton, P. D.; Bates, S.; Ryan, T. W.; Miles, S.; Tanner, B. K.

Book ID: 120250912
Publisher: American Institute of Physics
Year: 1988
Tongue: English
Weight: 905 KB
Volume: 63
Category: Article
ISSN: 0021-8979
DOI: 10.1063/1.339895

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