✦ LIBER ✦
Ge δ layer in Si(100) characterized by X-ray reflectivity, grazing incidence diffraction and standing-wave measurements
✍ Scribed by U. Beck; P. Yang; T. H. Metzger; J. Peisl; J. Falta; G. Materlik; T. Rupp; H. Baumgärtner; I. Eisele; J. R. Patel
- Publisher
- Italian Physical Society
- Year
- 1997
- Tongue
- English
- Weight
- 539 KB
- Volume
- 19
- Category
- Article
- ISSN
- 0392-6737
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