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Evaluation of thin MgF2 films by spectroscopic ellipsometry

✍ Scribed by N. Kaiser; A. Zuber; U. Kaiser

Book ID: 107864334
Publisher: Elsevier Science
Year: 1993
Tongue: English
Weight: 151 KB
Volume: 232
Category: Article
ISSN: 0040-6090
DOI: 10.1016/0040-6090(93)90754-d

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