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Cubic CdS thin films studied by spectroscopic ellipsometry

✍ Scribed by J. L MARTINEZ; G MARTINEZ; G TORRES-DELGADO; O GUZMAN; P. DEL ANGEL; O ZELAYA-ANGEL; R LOZADA-MORALES

Book ID: 110372600
Publisher: Springer US
Year: 1997
Tongue: English
Weight: 728 KB
Volume: 8
Category: Article
ISSN: 0957-4522
DOI: 10.1023/a:1018555826924

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