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Air pockets in thin porous platinum films studied by spectroscopic ellipsometry

✍ Scribed by S. Guo; E. Hedborg; I. Lundström; H. Arwin


Book ID
108388879
Publisher
Elsevier Science
Year
1997
Tongue
English
Weight
552 KB
Volume
293
Category
Article
ISSN
0040-6090

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Spectroscopic ellipsometry studies of Mg
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## Abstract Zn~1–__x__~ Mg__~x~__ O (ZMO) thin films with __x__ = 0, 0.1, 0.2, and 0.3 were prepared on Si(100) substrates by the sol–gel method. The influence of Mg content on the structural and the optical properties was studied by X‐ray diffraction and spectroscopic ellipsometry (SE) in the UV–v