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AlN:Cr thin films synthesized by pulsed laser deposition: Studies by X-ray diffraction and spectroscopic ellipsometry

✍ Scribed by A. Szekeres; S. Bakalova; S. Grigorescu; A. Cziraki; G. Socol; C. Ristoscu; I.N. Mihailescu

Publisher: Elsevier Science
Year: 2009
Tongue: English
Weight: 309 KB
Volume: 255
Category: Article
ISSN: 0169-4332
DOI: 10.1016/j.apsusc.2008.08.104

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