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X-ray photoelectron and X-ray absorption spectroscopic study on β-FeSi2 thin films fabricated by ion beam sputter deposition

✍ Scribed by F. Esaka; H. Yamamoto; N. Matsubayashi; Y. Yamada; M. Sasase; K. Yamaguchi; S. Shamoto; M. Magara; T. Kimura

Publisher
Elsevier Science
Year
2010
Tongue
English
Weight
435 KB
Volume
256
Category
Article
ISSN
0169-4332

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