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Evaluation of solder joint reliability in flip chip package under thermal shock test

✍ Scribed by Dae-Gon Kim; Jong-Woong Kim; Seung-Boo Jung


Book ID
108289157
Publisher
Elsevier Science
Year
2006
Tongue
English
Weight
696 KB
Volume
504
Category
Article
ISSN
0040-6090

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