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Enhanced strain relaxation of epitaxial SiGe layers on Si(1 0 0) after H+ ion implantation

✍ Scribed by B Holländer; S Mantl; R Liedtke; S Mesters; H.J Herzog; H Kibbel; T Hackbarth


Book ID
114170641
Publisher
Elsevier Science
Year
1999
Tongue
English
Weight
874 KB
Volume
148
Category
Article
ISSN
0168-583X

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