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Electronic defect states at ultrathin SiO2/Si interfaces from photoelectron yield spectroscopy

✍ Scribed by Seiichi Miyazaki; Tetsuhiro Maruyama; Atsushi Kohno; Masataka Hirose

Publisher: Elsevier Science
Year: 1999
Tongue: English
Weight: 168 KB
Volume: 2
Category: Article
ISSN: 1369-8001
DOI: 10.1016/s1369-8001(99)00013-x

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