SiSiO2 interface state spectroscopy using MOS tunneling structures: H. C. Card. Solid-St. Electron.22, 809 (1979)

• Publisher: Elsevier Science
• Year: 1980
• Tongue: English
• Weight: 122 KB
• Volume: 20
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(80)90491-6