Electron Microscopy and Structure of Materials
โ Scribed by Gareth Thomas (editor); Richard M. Fulrath (editor); Robert M. Fisher (editor)
- Publisher
- University of California Press
- Year
- 2020
- Tongue
- English
- Leaves
- 1310
- Edition
- Reprint 2020
- Category
- Library
No coin nor oath required. For personal study only.
๐ SIMILAR VOLUMES
<P>This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The third edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of
<p>This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A