<P>This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The third edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of
Transmission Electron Microscopy and Diffractometry of Materials
โ Scribed by B. Futz, J. Howe
- Publisher
- Springer
- Year
- 2008
- Tongue
- English
- Leaves
- 771
- Edition
- 3rd ed
- Category
- Library
No coin nor oath required. For personal study only.
๐ SIMILAR VOLUMES
<p>This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A
This textbook develops the concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. It emphasizes themes common to both techniques, such as scattering from atoms, wave interference, and the formation and analysis of d