Transmission Electron Microscopy and Dif
โ B. Futz, J. Howe
๐ Library
๐
2008
๐ Springer
๐ English
โฆ LIBER โฆ
๐
Transmission Electron Microscopy and Diffractometry of Materials
โ Scribed by Professor Brent Fultz, Professor James M. Howe (auth.)
- Publisher
- Springer Berlin Heidelberg
- Year
- 2001
- Tongue
- English
- Leaves
- 759
- Category
- Library
โฌ Acquire This Volume
No coin nor oath required. For personal study only.
โฆ Table of Contents
Front Matter....Pages I-XIX
Diffraction and the X-Ray Powder Diffractometer....Pages 1-61
The TEM and its Optics....Pages 63-121
Scattering....Pages 123-166
Inelastic Electron Scattering and Spectroscopy....Pages 167-224
Diffraction from Crystals....Pages 225-274
Electron Diffraction and Crystallography....Pages 275-337
Diffraction Contrast in TEM Images....Pages 339-422
Diffraction Lineshapes....Pages 423-465
Patterson Functions and Diffuse Scattering....Pages 467-522
High-Resolution TEM Imaging....Pages 523-593
Dynamical Theory....Pages 595-660
Back Matter....Pages 661-748
โฆ Subjects
Spectroscopy and Microscopy; Surface and Interface Science, Thin Films; Solid State Physics; Surfaces and Interfaces, Thin Films
๐ SIMILAR VOLUMES
Transmission Electron Microscopy and Dif
โ Prof. Dr. Brent Fultz, Prof. Dr. James M. Howe (auth.)
๐ Library
๐
2008
๐ Springer Berlin Heidelberg
๐ English
<P>This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The third edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of
Transmission Electron Microscopy and Dif
โ Professor Brent Fultz, Professor James M. Howe (auth.)
๐ Library
๐
2002
๐ Springer Berlin Heidelberg
๐ English
Transmission Electron Microscopy and Dif
โ Brent Fultz, James Howe (auth.)
๐ Library
๐
2013
๐ Springer-Verlag Berlin Heidelberg
๐ English
<p>This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A
Transmission Electron Microscopy and Dif
โ B. Futz, J. Howe
๐ Library
๐
2008
๐ Springer
๐ English
Transmission Electron Microscopy and Dif
โ Brent Fultz, James Howe
๐ Library
๐
2005
๐ Springer
๐ English
This textbook develops the concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. It emphasizes themes common to both techniques, such as scattering from atoms, wave interference, and the formation and analysis of d