๐”– Scriptorium
โœฆ   LIBER   โœฆ

๐Ÿ“

Transmission Electron Microscopy and Diffractometry of Materials

โœ Scribed by B. Futz, J. Howe


Publisher
Springer
Year
2008
Tongue
English
Leaves
771
Edition
3rd ed
Category
Library

โฌ‡  Acquire This Volume

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES


Transmission Electron Microscopy and Dif
โœ Prof. Dr. Brent Fultz, Prof. Dr. James M. Howe (auth.) ๐Ÿ“‚ Library ๐Ÿ“… 2008 ๐Ÿ› Springer Berlin Heidelberg ๐ŸŒ English

<P>This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The third edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of

Transmission Electron Microscopy and Dif
โœ Brent Fultz, James Howe (auth.) ๐Ÿ“‚ Library ๐Ÿ“… 2013 ๐Ÿ› Springer-Verlag Berlin Heidelberg ๐ŸŒ English

<p>This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A

Transmission Electron Microscopy and Dif
โœ Brent Fultz, James Howe ๐Ÿ“‚ Library ๐Ÿ“… 2005 ๐Ÿ› Springer ๐ŸŒ English

This textbook develops the concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. It emphasizes themes common to both techniques, such as scattering from atoms, wave interference, and the formation and analysis of d