Transmission Electron Microscopy and Dif
โ B. Futz, J. Howe
๐ Library
๐
2008
๐ Springer
๐ English
โฆ LIBER โฆ
๐
Transmission Electron Microscopy and Diffractometry of Materials
โ Scribed by Professor Brent Fultz, Professor James M. Howe (auth.)
- Publisher
- Springer Berlin Heidelberg
- Year
- 2002
- Tongue
- English
- Leaves
- 763
- Category
- Library
โฌ Acquire This Volume
No coin nor oath required. For personal study only.
โฆ Table of Contents
Front Matter....Pages I-XXI
Diffraction and the X-Ray Powder Diffractometer....Pages 1-61
The TEM and its Optics....Pages 63-121
Scattering....Pages 123-166
Inelastic Electron Scattering and Spectroscopy....Pages 167-224
Diffraction from Crystals....Pages 225-274
Electron Diffraction and Crystallography....Pages 275-338
Diffraction Contrast in TEM Images....Pages 339-422
Diffraction Lineshapes....Pages 423-464
Patterson Functions and Diffuse Scattering....Pages 465-520
High-Resolution TEM Imaging....Pages 521-596
Dynamical Theory....Pages 597-661
Back Matter....Pages 663-748
โฆ Subjects
Surfaces and Interfaces, Thin Films;Solid State Physics;Spectroscopy and Microscopy;Crystallography;Characterization and Evaluation of Materials
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Transmission Electron Microscopy and Dif
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