Transmission Electron Microscopy and Diffractometry of Materials

✍ Scribed by Brent Fultz, James Howe (auth.)

• Publisher: Springer-Verlag Berlin Heidelberg
• Year: 2013
• Tongue: English
• Leaves: 774
• Series: Graduate Texts in Physics
• Edition: 4
• Category: Library

✦ Synopsis

This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.

✦ Table of Contents

Front Matter....Pages I-XX
Diffraction and the X-Ray Powder Diffractometer....Pages 1-57
The TEM and Its Optics....Pages 59-115
Neutron Scattering....Pages 117-144
Scattering....Pages 145-180
Inelastic Electron Scattering and Spectroscopy....Pages 181-236
Diffraction from Crystals....Pages 237-288
Electron Diffraction and Crystallography....Pages 289-348
Diffraction Contrast in TEM Images....Pages 349-427
Diffraction Lineshapes....Pages 429-462
Patterson Functions and Diffuse Scattering....Pages 463-520
High-Resolution TEM Imaging....Pages 521-586
High-Resolution STEM and Related Imaging Techniques....Pages 587-615
Dynamical Theory....Pages 617-679
Back Matter....Pages 681-761

✦ Subjects

Spectroscopy and Microscopy;Characterization and Evaluation of Materials;Spectroscopy/Spectrometry;Surfaces and Interfaces, Thin Films;Surface and Interface Science, Thin Films