## Abstract This paper describes two types of cross‐linked positive‐working electron resists. The first is based upon phenol‐formaldehyde resins crosslinked to poly‐(methyl methacrylate) by phenolic ester groups. The second type is based upon polystyrene, crosslinked by carboxylic acid anhydride gr
Electron-beam-resist materials with enhanced dry etch resistance
✍ Scribed by Stanley Affrossman; Hassan Angadji; Masood Bakhshaee; Kathleen Coffey; Fong Lung Chow; David Hayward; Gordon G. McLeod; Richard A. Pethrick; Paul Whittaker
- Publisher
- Elsevier Science
- Year
- 1989
- Tongue
- English
- Weight
- 529 KB
- Volume
- 30
- Category
- Article
- ISSN
- 0032-3861
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