Creep-controlled electromigration in nea
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E. Glickman; M. Nathan
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Article
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2000
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Elsevier Science
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English
β 96 KB
A model of creep affected electromigration (CAEM) in near-threshold conductors ('near-threshold' denoting length L or current density j close to the corresponding Blech thresholds L and j ) is shown to fit electromigration (EM) threshold and th th kinetics data better than the Blech model. Its most