✦ LIBER ✦

Electromigration characteristics of copper interconnects

✍ Scribed by Tao, J.; Cheung, N.W.; Hu, C.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Electromigration resistance of copper in

✍ D. Save; F. Braud; J. Torres; F. Binder; C. Müller; J.O. Weidner; W. Hasse 📂 Article 📅 1997 🏛 Elsevier Science 🌐 English ⚖ 483 KB

Electromigration threshold in copper int

✍ Wang, P.-C.; Filippi, R. G. 📂 Article 📅 2001 🏛 American Institute of Physics 🌐 English ⚖ 285 KB

Electromigration in width transition cop

✍ Arijit Roy; Yuejin Hou; Cher Ming Tan 📂 Article 📅 2009 🏛 Elsevier Science 🌐 English ⚖ 510 KB

Electromigration failure in ultra-fine c

✍ Nancy L. Michael; Choong-Un Kim; Paul Gillespie; Rod Augur 📂 Article 📅 2003 🏛 Springer US 🌐 English ⚖ 203 KB

Electromigration failure modes in damasc

✍ L. Arnaud; R. Gonella; G. Tartavel; J. Torrès; C. Gounelle; Y. Gobil; Y. Morand 📂 Article 📅 1998 🏛 Elsevier Science 🌐 English ⚖ 479 KB

Electromigration Performance of Multi-le

✍ S. Yokogawa; N. Okada; Y. Kakuhara; H. Takizawa 📂 Article 📅 2001 🏛 Elsevier Science 🌐 English ⚖ 767 KB