𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Electrically and radiation induced leakage currents in thin oxides

✍ Scribed by A Scarpa; P Riess; G Ghibaudo; A Paccagnella; G Pananakakis; M Ceschia; G Ghidini


Book ID
108362471
Publisher
Elsevier Science
Year
2000
Tongue
English
Weight
403 KB
Volume
40
Category
Article
ISSN
0026-2714

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES


Stress induced leakage current in ultra-
✍ A. Scarpa; G. Ghibaudo; G. Ghidini; G. Pananakakis; A. Paccagnella πŸ“‚ Article πŸ“… 1997 πŸ› Elsevier Science 🌐 English βš– 216 KB

Constant current stress induced leakage currents are studied in very thin oxide devices, for both stress polarities. This current has been investigated for both positive and negative gate voltage measurements. Stress induced leakage current (SILC) physical nature has been studied and an interpretati