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Stress-induced leakage currents in thin silicon dioxide films

โœ Scribed by B. Pesic; L. J. Vracar; N. Stojadinovic; M. Pecovska-Djordjevic; N. Novkovski


Book ID
111558072
Publisher
Springer US
Year
2003
Tongue
English
Weight
291 KB
Volume
14
Category
Article
ISSN
0957-4522

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