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Electrical effects of plasma damage in p-GaN

✍ Scribed by Cao, X. A.; Pearton, S. J.; Zhang, A. P.; Dang, G. T.; Ren, F.; Shul, R. J.; Zhang, L.; Hickman, R.; Van Hove, J. M.

Book ID: 118263850
Publisher: American Institute of Physics
Year: 1999
Tongue: English
Weight: 359 KB
Volume: 75
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.125080

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