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Plasma damage in p-GaN

✍ Scribed by X. A. Cao; A. P. Zhang; G. T. Dang; F. Ren; S. J. Pearton; J. M. van Hove; R. A. Hickman; R. J. Shul; L. Zhang

Book ID: 107452413
Publisher: Springer US
Year: 2000
Tongue: English
Weight: 326 KB
Volume: 29
Category: Article
ISSN: 0361-5235
DOI: 10.1007/s11664-000-0059-7

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