๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Electrical characterization of low temperature deposited oxide films on ZnO/n-Si substrate

โœ Scribed by S. K. Nandi; S. Chatterjee; S. K. Samanta; P. K. Bose; C. K. Maiti


Book ID
110643605
Publisher
Springer-Verlag
Year
2003
Tongue
English
Weight
275 KB
Volume
26
Category
Article
ISSN
0250-4707

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES