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Effects of processing parameters on the properties of tantalum nitride thin films deposited by reactive sputtering

✍ Scribed by J. Nazon; J. Sarradin; V. Flaud; J.C. Tedenac; N. Fréty


Book ID
116603053
Publisher
Elsevier Science
Year
2008
Tongue
English
Weight
865 KB
Volume
464
Category
Article
ISSN
0925-8388

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