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Effects of co-sputtering powers on the properties of silicon-incorporated zinc oxide used as a channel layer of thin film transistors

✍ Scribed by Lee, Sang-Hyuk; Kim, Won; Park, Jin-Seok

Book ID: 122240550
Publisher: Elsevier Science
Year: 2013
Tongue: English
Weight: 848 KB
Volume: 549
Category: Article
ISSN: 0040-6090
DOI: 10.1016/j.tsf.2013.08.073

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