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Effects of post-annealing temperature on carbon incorporated amorphous indium–zinc-oxide thin-film transistors fabrication using sputtering at room temperature

✍ Scribed by Parthiban, Shanmugam; Kwon, Jang-Yeon

Book ID: 126834128
Publisher: The Royal Society of Chemistry
Year: 2014
Tongue: English
Weight: 871 KB
Volume: 4
Category: Article
ISSN: 2046-2069
DOI: 10.1039/c4ra01782j

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