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Effects of channel thickness variation on bias stress instability of InGaZnO thin-film transistors

✍ Scribed by Edward Namkyu Cho; Jung Han Kang; Ilgu Yun

Book ID
113800538
Publisher
Elsevier Science
Year
2011
Tongue
English
Weight
667 KB
Volume
51
Category
Article
ISSN
0026-2714

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