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Positive bias temperature instability of irradiated n-channel thin film transistors

✍ Scribed by Jelenković, Emil V.; Kovačević, Milan S.; Stupar, Dragan Z.; Jha, Shrawan; Bajić, Jovan S.; Tong, K.Y.


Book ID
122249075
Publisher
Elsevier Science
Year
2014
Tongue
English
Weight
490 KB
Volume
556
Category
Article
ISSN
0040-6090

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