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Positive Gate-Bias Temperature Stability of RF-Sputtered Active-Layer Thin-Film Transistors

✍ Scribed by Yi-Shiuan Tsai; Jian-Zhang Chen

Book ID: 114620771
Publisher: IEEE
Year: 2012
Tongue: English
Weight: 931 KB
Volume: 59
Category: Article
ISSN: 0018-9383
DOI: 10.1109/ted.2011.2172212

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