✦ LIBER ✦

Uniformity and bias-temperature instability of bottom-gate zinc oxide thin-film transistors (ZnO TFTs)

✍ Scribed by Mamoru Furuta; Mutsumi Kimura; Takahiro Hiramatsu; Takashi Nakanishi; Chaoyang Li; Takashi Hirao

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Temperature and gate bias dependence of

✍ Huang, Xiaoming; Wu, Chenfei; Lu, Hai; Ren, Fangfang; Chen, Dunjun; Jiang, Rong; 📂 Article 📅 2013 🏛 Elsevier Science 🌐 English ⚖ 954 KB

Role of incorporated hydrogen on perform

✍ Kim, Hyo Jin; Park, Se Yeob; Jung, Hong Yoon; Son, Byeong Geun; Lee, Chang-Kyu; 📂 Article 📅 2012 🏛 Institute of Physics 🌐 English ⚖ 428 KB