Temperature and gate bias dependence of carrier transport mechanisms in amorphous indium–gallium–zinc oxide thin film transistors

✍ Scribed by Huang, Xiaoming; Wu, Chenfei; Lu, Hai; Ren, Fangfang; Chen, Dunjun; Jiang, Rong; Zhang, Rong; Zheng, Youdou; Xu, Qingyu

• Book ID: 120399111
• Publisher: Elsevier Science
• Year: 2013
• Tongue: English
• Weight: 954 KB
• Volume: 86
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/j.sse.2013.04.025