✦ LIBER ✦
Oxygen-Adsorption-Induced Anomalous Capacitance Degradation in Amorphous Indium-Gallium-Zinc-Oxide Thin-Film-Transistors under Hot-Carrier Stress
✍ Scribed by Chung, W.-F.; Chang, T.-C.; Lin, C.-S.; Tu, K.-J.; Li, H.-W.; Tseng, T.-Y.; Chen, Y.-C.; Tai, Y.-H.
- Book ID
- 125492590
- Publisher
- The Electrochemical Society
- Year
- 2012
- Tongue
- English
- Weight
- 215 KB
- Volume
- 159
- Category
- Article
- ISSN
- 0013-4651
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