Role of incorporated hydrogen on performance and photo-bias instability of indium gallium zinc oxide thin film transistors

✍ Scribed by Kim, Hyo Jin; Park, Se Yeob; Jung, Hong Yoon; Son, Byeong Geun; Lee, Chang-Kyu; Lee, Chul-Kyu; Jeong, Jong Han; Mo, Yeon-Gon; Son, Kyoung Seok; Ryu, Myung Kwan; Lee, Sangyoon; Jeong, Jae Kyeong

• Book ID: 120498021
• Publisher: Institute of Physics
• Year: 2012
• Tongue: English
• Weight: 428 KB
• Volume: 46
• Category: Article
• ISSN: 0022-3727
• DOI: 10.1088/0022-3727/46/5/055104