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Origin of threshold voltage instability in indium-gallium-zinc oxide thin film transistors

✍ Scribed by Jeong, Jae Kyeong; Won Yang, Hui; Jeong, Jong Han; Mo, Yeon-Gon; Kim, Hye Dong

Book ID: 120706988
Publisher: American Institute of Physics
Year: 2008
Tongue: English
Weight: 644 KB
Volume: 93
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.2990657

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