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Effect of reactive sputtered SiOx passivation layer on the stability of InGaZnO thin film transistors

✍ Scribed by Jun Li; Fan Zhou; Hua-Ping Lin; Wen-Qing Zhu; Jian-Hua Zhang; Xue-Yin Jiang; Zhi-Lin Zhang

Book ID
116965155
Publisher
Elsevier Science
Year
2012
Tongue
English
Weight
541 KB
Volume
86
Category
Article
ISSN
0042-207X

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