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Bias-stress induced instability of organic thin film transistors

โœ Scribed by M. Matters; D.M. de Leeuw; P.T. Herwig; A.R. Brown


Book ID
117542928
Publisher
Elsevier Science
Year
1999
Tongue
English
Weight
209 KB
Volume
102
Category
Article
ISSN
0379-6779

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Origin of bias stress induced instabilit
โœ Y. Yan; X.J. She; H. Zhu; S.D. Wang ๐Ÿ“‚ Article ๐Ÿ“… 2011 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 606 KB

We report a study on the contact resistance instability induced by the bias stress in staggered pentacene thin film transistors, combining the bias stress measurements with the transfer line method. The contact resistance is increasing with the stress time, and two device parameters are found to con