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Light-induced bias stress reversal in polyfluorene thin-film transistors

✍ Scribed by Salleo, A.; Street, R. A.


Book ID
115519073
Publisher
American Institute of Physics
Year
2003
Tongue
English
Weight
396 KB
Volume
94
Category
Article
ISSN
0021-8979

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We report a study on the contact resistance instability induced by the bias stress in staggered pentacene thin film transistors, combining the bias stress measurements with the transfer line method. The contact resistance is increasing with the stress time, and two device parameters are found to con