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Bias temperature instability in hydrogenated thin-film transistors

✍ Scribed by Bhat, N.; Cao, M.; Saraswat, K.C.

Book ID: 114536877
Publisher: IEEE
Year: 1997
Tongue: English
Weight: 169 KB
Volume: 44
Category: Article
ISSN: 0018-9383
DOI: 10.1109/16.595937

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