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Effects of gate-bias stress on ZnO thin-film transistors

✍ Scribed by Liang-Yu Su; Hsin-Ying Lin; Sung-Li Wang; Yung-Hui Yeh; Chun-Cheng Cheng; Lung Han Peng; Jian-Jang Huang

Book ID: 119988250
Publisher: Society for Information Display
Year: 2010
Tongue: English
Weight: 239 KB
Volume: 18
Category: Article
ISSN: 1071-0922
DOI: 10.1889/jsid18.10.802

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