✦ LIBER ✦
Analysis of stability improvement in ZnO thin film transistor with dual-gate structure under negative bias stress
✍ Scribed by Yun, Ho-Jin; Kim, Young-Su; Jeong, Kwang-Seok; Kim, Yu-Mi; Yang, Seung-dong; Lee, Hi-Deok; Lee, Ga-Won
- Book ID
- 126765648
- Publisher
- Institute of Pure and Applied Physics
- Year
- 2014
- Tongue
- English
- Weight
- 832 KB
- Volume
- 53
- Category
- Article
- ISSN
- 0021-4922
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