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Effect of post oxidation annealing on electrical characteristics of Ni/SiO2/4H-SiC capacitor with varying oxide thickness

✍ Scribed by Sanjeev K. Gupta; A. Azam; J. Akhtar

Book ID: 114992393
Publisher: Springer
Year: 2012
Tongue: English
Weight: 299 KB
Volume: 46
Category: Article
ISSN: 1063-7826
DOI: 10.1134/s1063782612040070

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