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Effect of N2O nitridation on the electrical properties of MOS gate oxides

โœ Scribed by A Pacelli; A.L Lacaita; A Spinelli; R Bez


Book ID
108362215
Publisher
Elsevier Science
Year
1998
Tongue
English
Weight
153 KB
Volume
38
Category
Article
ISSN
0026-2714

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