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Effect of interfacial oxide on Ge MOSCAP and N-MOSFET characteristics

โœ Scribed by Duygu Kuzum; Jin-Hong Park; Tejas Krishnamohan; Krishna C. Saraswat


Book ID
113797725
Publisher
Elsevier Science
Year
2011
Tongue
English
Weight
434 KB
Volume
88
Category
Article
ISSN
0167-9317

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