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The Effect of Donor/Acceptor Nature of Interface Traps on Ge MOSFET Characteristics

โœ Scribed by Kuzum, D.; Jin-Hong Park; Krishnamohan, T.; Wong, H.-S.P.; Saraswat, K.C.


Book ID
114620429
Publisher
IEEE
Year
2011
Tongue
English
Weight
971 KB
Volume
58
Category
Article
ISSN
0018-9383

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