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Effect of hydrogen annealing on hot-carrier instability of X-Ray irradiated CMOS devices

โœ Scribed by C. C. H. Hsu; L. K. Wang; D. Zicherman; A. Acovic


Book ID
112815109
Publisher
Springer US
Year
1992
Tongue
English
Weight
398 KB
Volume
21
Category
Article
ISSN
0361-5235

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