✦ LIBER ✦
Radiation damage and its effect on hot-carrier induced instability of 0.5 μm CMOS devices patterned using synchrotron x-ray lithography
✍ Scribed by C. C. H. Hsu; L. K. Wang; J. Y. C. Sun; M. R. Wordeman; T. H. Ning
- Book ID
- 112814863
- Publisher
- Springer US
- Year
- 1990
- Tongue
- English
- Weight
- 501 KB
- Volume
- 19
- Category
- Article
- ISSN
- 0361-5235
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